International Test Conference

International Test Conference 2008 will again be held in Santa Clara from October 28-30, 2008. Please check back for additional details in the near future. If you are interested in submitting a paper for ITC 2008, please download the 2008 Call for Papers. Submissions are due February 15, 2008.

ITC is initiating a poster session this year. You can present late-breaking news or get feedback on innovative ideas--without having to write a full paper. One-page poster summaries will be included in the ITC Proceedings. Click here for details.

International Test Conference, the cornerstone of TestWeek(tm), is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

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