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ITC 2016 Keynote Speaker: Walden C. Rhines, Chairman and Chief Executive Officer, Mentor Graphics

Mr. Rhines will give the keynote address, The Business of Test: Test and Semiconductor Economics
at the Plenary Session of ITC, November 15, 2016 at 9 am.

Wally Rhines, Mentor

Test methodology changes have historically been driven largely by necessity—critical needs for cost reduction or quality improvements. This history makes possible the prediction of future changes. Dr. Rhines will review the driving forces for prior discontinuities in design-for-test, analyze the rates of adoption of new test methodologies, and discuss the likely forces that will change our test priorities in the future.

Walden C. Rhines is Chairman and Chief Executive Officer of Mentor Graphics, a leader in worldwide electronic design automation with revenue of $1.2 billion in 2015. During his tenure at Mentor Graphics, revenue has nearly quadrupled and Mentor has grown the industry’s number one market share solutions in four of the ten largest product segments of the EDA industry. He joined Mentor in 1993 from Texas Instruments (TI) where he was most recently Executive Vice President in charge of TI’s semiconductor business. Rhines has served five terms as Chairman of the Electronic Design Automation Consortium. He is also a board member of the Semiconductor Research Corporation and First Growth Children and Family Charities. He received a BSE degree from the University of Michigan, an MS and Ph.D. from Stanford University, an MBA from Southern Methodist University and Honorary Doctor of Technology degrees from Nottingham Trent University and the University of Florida.

ITC 2016 Thursday Keynote Speaker: Ken Hansen, CEO, Semiconductor
Research Corporation

Mr. Hansen will give the Thursday keynote address, Addressing Semiconductor Industry Needs: Defining the Future Through Creative, Exciting Research
Thursday, November 17, 2016 at 11:00 am

Ken Hansen, SRC

In the history of the semiconductor industry, there has been no other period in time with as much uncertainty in the way forward. But with uncertainty comes great opportunity. There is a need for transformative innovation fueled by breakthrough research to reinvigorate the growth of the industry. This talk will identify some of the new exciting challenges the industry is facing and research areas where investment is needed to address them. Systems of the future —autonomous vehicles, internet of things, self-adaptive configurations modeled on biology—will require advanced techniques to test them, secure them, reduce their power, and produce them without error. This increase in complexity coupled, with a decreasing ability to rely on deterministic circuits, requires new approaches to be created by cross-disciplinary teams co-optimizing across the entire design hierarchy space.

More information can be found on the keynote page.

ITC 2016 Wednesday Keynote Speaker: Professor Rob A. Rutenbar, University of Illinois, Urbana-Champaign

Prof. Rutenbar will give the Wednesday keynote address, Hardware Inference Accelerators for Machine Learning
Wednesday, November 16, 2016 at 4:30 pm. This is a special keynote in honor of Professor Edward J. McCluskey

Rob Rutenbar, University of Illinois

Machine learning (ML) technologies have revolutionized the ways in which we interact with large-scale, imperfect, real-world data. As a result, there is rising interest in opportunities to implement ML efficiently in custom hardware. We have designed hardware for one broad class of ML techniques: Inference on Probabilistic Graphical Models (PGMs). In these graphs, labels on nodes encode what we know and “how much” we believe it; edges encode belief relationships among labels; statistical inference answers questions such as “if we observe some of the labels in the graph, what are most likely labels on the remainder?” These problems are interesting because they can be very large (e.g., every pixel in an image is one graph node) and because we need answers very fast (e.g., at video frame rates). Inference done as iterative Belief Propagation (BP) can be efficiently implemented in hardware, and we demonstrate several examples from current FPGA prototypes. We have the first configurable, scalable parallel architecture capable of running a range of standard vision benchmarks, with speedups up to 40X over conventional software. We also show that BP hardware can be made remarkably tolerant to the low-level statistical upsets expected in end-of-Moore’s-Law nanoscale silicon and post-silicon circuit fabrics, and summarize some effective resilience mechanisms in our prototypes.

More information can be found on the keynote page.

ITC 2016 Advance Program Available

The 2016 ITC Advance Program is now available for download. The AP gives you all the information you need on Testweek activities, including papers, keynotes, panels, tutorials, workshops – and parties too. Download it here .
The AP will be updated as details are finalized. Follow us on Twitter to learn of updates.
Last revision: 10/24/16.

You can also see the technical program on-line – click the ITC Program button above or Click Here.

ITC Registration Now Open

Registration for ITC 2016 is now open. Visit the Registration Page for the registration link and also to reserve your room in Fort Worth.

The ITC Nano-Blog – Updated 9/26/16, 10:01 pm – Welcome our Student Blogger, Allison Garcia

The ITC Nano-Blog has real-time thoughts about this year’s conference. Read it, and send your own contributions. Find it at This entry is an introductory blog from our new student blogger,Allison Garcia, from SMU.
Also, a blog from me on the Advance Program, Registering, a way of saving money for your company and getting something out of it, and parties.

Test Week Tutorial Details Now Available

In 2016 ITC offers 12 excellent tutorials to get you started on an area of test or to help you go into more depth in an area you are already familiar with. You can find out more details about the tutorials at the
Tutorials Page or by clicking the Tutorials button above.

Call for Submissions: IEEE International Workshop on
Defects, Adaptive Test, Yield and Data
Analysis – DATA-2016

The DATA-2016 workshop has issued a Call for Submissions. The due date for submissions is October 7.
Get the Call for Submissions here or go to the workshop website.

ITC is proud to host the NXP Smarter World Tour

Experience NXP’s Smarter World Tour at ITC as the famed “Lab on Wheels” brings the Internet of Things to life on the exhibit floor at ITC. With more than 170 demos that let you interact with ADAS demos, RF cooking devices, Smart home automation, wearables and more, you will get a first-hand look at the connected world of tomorrow.
this link to get to the NXP Smarter World Tour home page and watch a video about the truck.

Hotel Reservations for ITC2016 in Fort Worth Available

Reservations for the two ITC Hotels in Fort Worth, the Sheraton and the Omni, are available through Connections Housing which is the only authorized way to make your reservations.

Call for Volunteers for ITC

ITC is a volunteer driven conference. Besides paper authors, paper reviewers and program committee members, many people work behind the scenes to put on ITC each year. It is a big job and we need help.
Here is more information on volunteer opportunities and how to contact us. Thanks for supporting ITC.

Evaluation Engineering Magazine and ITC are Media Partners

Evaluation Engineering is the magazine for engineers and engineering managers responsible for test and total product quality in electronics. Evaluation Engineering is written by engineers for engineers Visit them at or on the ITC Exhibit Floor in October.

Press Coverage of ITC

Coverage of ITC in Evaluation Engineering

ITC Announces Partnership with VLSI.

VLSI is an award-winning provider of market research and economic analysis on the technical, business, and economic aspects within semiconductor, nanotechnology, and related industries. VLSI provides intelligence for faster and better decision making in the areas of semiconductors, photovoltaics, LEDs, display, manufacturing, materials, and critical subsystems. VLSI was founded in 1976.
Visit them at

About ITC

International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification and validation, test (DFT, ATPG, and BIST), diagnosis, failure analysis and back to process, yield, reliability and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

Updates and News

About International Test Conference

Background information about ITC.

Important Links

The ITC Exhibitors Home Page

ITC Group on Linked in.

Media Partners

Author Log-in to ITC Program Site

More information:

ITC office
phone: +1 (202) 973-8665
fax: +1 (202) 331-0111