Welcome to the 2016 ITC Web
ITC Is Now Accepting Nominations for the 2016 Gerald W. Gordon Award for Student Volunteerism
The Gerald W. Gordon Award is an award to students in recognition of volunteer work for one or more IEEE conferences, symposia, workshops and/or organizations dedicated to the development of electronics design and testing fields. Nominations for the award are now open.
Find more information on the Award and the nomination process on the Gerald W. Gordon Award page.
Hotel Reservations for ITC2016 in Fort Worth Available
Reservations for the two ITC Hotels in Fort Worth, the Sheraton and the Omni, are available through Connections Housing which is the only authorized way to make your reservations.
ITC is a volunteer driven conference. Besides paper authors, paper reviewers and program committee members, many people work behind the scenes to put on ITC each year. It is a big job and we need help.
Here is more information on volunteer opportunities and how to contact us. Thanks for supporting ITC.
The ITC Nano-Blog – Updated 3/29/16, 10:01 pm – The Joy of ITC Papers
Read the ITC 2015 Keynote Address by Bill Bottoms
Initial 2016 ITC Exhibitors Announced
We are happy to announce the first 34 ITC Exhibitors for 2016. You can find a page for each exhibitor with contact information, a short summary of their products and services, and a link to their web pages on the Exhibitors Page. We also have a List of Exhibitors with booth numbers and a link to their pages, and the first version of the PDF Floorplan for Fort Worth. An interactive floorplan is coming soon.
Interested in exhibiting at ITC? Click on the Exhibiting at ITC link on our menu below the banner and above the bulls for more information.
Sign Up to Exhibit at ITC 2016
Interested in showing your test products to leaders in the field? Sign up to exhibit at the 2016 ITC in Fort Worth. Full details on exhibiting are available on the Exhibiting at ITC Page and in the Exhibitor’s Manual – also available through the button above.
ITC 2015 Keynotes
ITC 2015 Plenary Keynote Speaker: Dr. Karim Arabi, VP Engineering, Qualcomm
ITC 2015 Wednesday Keynote Speaker: Professor Andrew B. Kahng, University of California, San Diego
ITC 2015 Thursday Keynote Speaker: Dr. William R. Bottoms, Chairman, Third Millennium Test Solutions
You can find summaries of these three great talks and biographies of the speakers on the Keynote Page.
ITC Welcomes Chip Design Magazine as a Media Partner
Chip Design covers all of the technical challenges and implementation options engineers face in the development and manufacture of today’s complex integrated circuits. Chip Design is the only media network dedicated to the advanced IC Design market. Visit www.chipdesignmag.com to stay informed about the latest developments in chip modeling, architecture, design, test and manufacture, from EDA tools to digital and analog hardware issues. The System Level Design and Low Power Engineering Portals offer focused editorial content you won’t want to miss. And, be sure to visit www.http://eecatalog.com/ for valuable information about all of Extension Media’s outstanding technology resources.
Evaluation Engineering Magazine and ITC are Media Partners
Evaluation Engineering is the magazine for engineers and engineering managers responsible for test and total product quality in electronics. Evaluation Engineering is written by engineers for engineers Visit them at http://www.evaluationengineering.com or on the ITC Exhibit Floor in October.
Press Coverage of ITC
ITC Announces Partnership with VLSI.
|VLSI is an award-winning provider of market research and economic analysis on the technical, business, and economic aspects within semiconductor, nanotechnology, and related industries. VLSI provides intelligence for faster and better decision making in the areas of semiconductors, photovoltaics, LEDs, display, manufacturing, materials, and critical subsystems. VLSI was founded in 1976.
Visit them at www.vlsiresearch.com
International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification and validation, test (DFT, ATPG, and BIST), diagnosis, failure analysis and back to process, yield, reliability and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.
Updates and News
About International Test ConferenceBackground information about ITC.
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