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  <content>&lt;h1&gt;Welcome to the 2010 &lt;span class="caps"&gt;ITC&lt;/span&gt; Web&lt;/h1&gt;
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&lt;h3&gt;Start planning to attend &lt;span class="caps"&gt;ITC&lt;/span&gt; 2010&lt;/h3&gt;
&lt;p&gt;2010 TestWeek will be in Austin once, more, from October 31 &amp;#8211; November 5 2010. &lt;span class="caps"&gt;ITC&lt;/span&gt; itself will be held November 2 &amp;#8211; 4. The &lt;a href="http://itctestweek.org/files/CurrentCFP.pdf"&gt; 2010 &lt;span class="caps"&gt;ITC&lt;/span&gt; Call for Papers&lt;/a&gt; is now available. See you in Austin in 2010!&lt;/p&gt;
&lt;p&gt;There are many ways to get involved with &lt;span class="caps"&gt;ITC&lt;/span&gt;.&lt;/p&gt;
&lt;ul&gt;
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&lt;p&gt;&lt;b&gt;Write and submit a regular or lecture series paper to &lt;span class="caps"&gt;ITC&lt;/span&gt;.&lt;/b&gt; The &lt;a href="http://itctestweek.org/files/CurrentCFP.pdf"&gt;Call for Papers&lt;/a&gt; is now available. If you are not already registered, register now at the &lt;a href="http://www.itcprogram.org"&gt;&lt;span class="caps"&gt;ITC&lt;/span&gt; Program Site&lt;/a&gt;&lt;/p&gt;
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&lt;p&gt;&lt;b&gt;Exhibit at &lt;span class="caps"&gt;ITC&lt;/span&gt;.&lt;/b&gt;  &lt;span class="caps"&gt;ITC&lt;/span&gt;, with an attendee base of test experts and decision makers, is the best place to get in touch with existing and potential customers. See the &lt;a href="http://itctestweek.org/exhibiting"&gt;Exhibiting at &lt;span class="caps"&gt;ITC&lt;/span&gt; page&lt;/a&gt; for more information.&lt;/p&gt;
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&lt;p&gt;&lt;b&gt;Volunteer at &lt;span class="caps"&gt;ITC&lt;/span&gt;.&lt;/b&gt; Sign up as an &lt;span class="caps"&gt;ITC&lt;/span&gt; paper reviewer at the &lt;a href="http://www.itcprogram.org"&gt;&lt;span class="caps"&gt;ITC&lt;/span&gt; Program Site&lt;/a&gt;, and contact a member of the &lt;a href="http://itcprogram.org/itc2000/admin/current-program-comm.asp"&gt; Program Committee&lt;/a&gt; responsible for your area of expertise to request papers to review, after the paper deadline date.&lt;br /&gt;
&lt;br&gt;&lt;br /&gt;
&lt;span class="caps"&gt;ITC&lt;/span&gt; is also looking for volunteers to help with marketing the conference in Austin and for many other jobs.&lt;br /&gt;
Use the &lt;b&gt;Contact Us&lt;/b&gt; link below for more information.&lt;/p&gt;
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&lt;p&gt;&lt;b&gt;Attend &lt;span class="caps"&gt;ITC&lt;/span&gt;.&lt;/b&gt; The Advance Program  will be available in July, which is when registration will be opened.&lt;/p&gt;
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&lt;h3&gt;&lt;a href="http://itctestweek.org/about/photos"&gt; The &lt;span class="caps"&gt;ITC&lt;/span&gt; Photo Gallery&lt;/a&gt;&lt;/h3&gt;
&lt;h2&gt;International Test Conference&lt;/h2&gt;
  &lt;p&gt;International Test Conference, the cornerstone of TestWeek&amp;#8482; events, is the world&amp;#8217;s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At &lt;span class="caps"&gt;ITC&lt;/span&gt;, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.&lt;/p&gt;
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&lt;h2&gt; Congratulations to 2008 Best Paper Award Winners and Honorable Mentions &lt;/h2&gt;
&lt;h3&gt;&lt;span class="caps"&gt;ITC&lt;/span&gt; Ned Kornfield Best Paper Award for 2008&lt;/h3&gt;
&lt;p&gt;&lt;i&gt;Test Access Mechanism for Multiple Identical Cores,&lt;/i&gt; by G. Giles, J. Wang, A. Seghal, L.J. Balakrishnan, and J. Wingfield, Advanced Micro Devices&lt;br /&gt;
&lt;h3&gt; Honorable Mentions&lt;/p&gt;
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&lt;p&gt;
&lt;p&gt;&lt;i&gt;A Method to Generate a Very-Low-Distortion, High-Frequency Sine Waveform Using an &lt;span class="caps"&gt;AWG&lt;/span&gt;,&lt;/i&gt; A. Maeda, Verigy Japan&lt;/p&gt;
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&lt;p&gt;&lt;i&gt;Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data,&lt;/i&gt; M. Sharma, R. Benware, L. Ling, D. Abercrombie, L. Lee, M. Keim, H. Tang, W-T. Cheng, T-P. Tai, Mentor Graphics,; Y-J. Chang, R. Lin, &lt;span class="caps"&gt;UMC&lt;/span&gt;; A. Man, Advanced Micro Devices&lt;/p&gt;
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  &lt;h2&gt;&lt;span&gt;&lt;b&gt;Important Links&lt;/b&gt;&lt;/span&gt;&lt;/h2&gt;
&lt;h3&gt;&lt;a href="http://209.20.84.192/exhibitors/2009-exhibitor-table"&gt;Complete List of 2009 Exhibitors.&lt;/a&gt;&lt;/h3&gt;
&lt;h3&gt;&lt;a href="http://209.20.84.192/exhibitors"&gt;&lt;span class="caps"&gt;ITC&lt;/span&gt; Exhibitors with additional information.&lt;/a&gt; Click the logo for the exhibitor page.&lt;/h3&gt;
&lt;h3&gt;&lt;a href="http://209.20.84.192/supporters/media-partners"&gt;Media Partners&lt;/a&gt;&lt;/h3&gt;
&lt;h3&gt;&lt;a href="http://www.itcprogram.org"&gt;Author Log-in to &lt;span class="caps"&gt;ITC&lt;/span&gt; Program Site&lt;/a&gt;&lt;br /&gt;
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&lt;h2&gt; More information:&lt;/h2&gt;
&lt;p&gt;&lt;b&gt;&lt;span class="caps"&gt;ITC&lt;/span&gt; office&lt;/b&gt;&lt;br /&gt;
phone: +1 (202) 973-8665&lt;br /&gt;
fax: +1 (202) 331-0111&lt;br /&gt;
&lt;a href="mailto:ITC@courtesyassoc.com"&gt;email: ITC@courtesyassoc.com&lt;/a&gt;&lt;/p&gt;
&lt;/div&gt;</content>
  <created-at type="datetime">2008-08-11T17:13:45Z</created-at>
  <id type="integer">8</id>
  <name>Home</name>
  <updated-at type="datetime">2010-02-08T19:31:22Z</updated-at>
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