| Aehr Test Systems | 424 | M & M Specialties, Inc. | 618 |
| Amphenol InterCon Systems, Inc. | 703 | MEI | 401 |
| Antares Advanced Test Technologies | 702 | Mentor Graphics Corporation | 112 |
| Ardent Concepts, Inc. | 602 | Micro Control Company | 302 |
| ARM, Inc. | 92 | MicroProbe, Inc. | 97 |
| ASSET InterTech, Inc. | 404 | Nano Integrated Solutions, Inc. | 605 |
| Atrenta, Inc. | 122 | NHK Spring Co., LTD. | 89 |
| Austin Convention and Visitors Bureau | 826 | Onanon, Inc. | 632 |
| Averna | 935 | OptimalTest | 518 |
| Azimuth Electronics, Inc. | 705 | Phoenix Test Arrays, LLC | 717 |
| BucklingBeam | 410 | Pickering Electronics Ltd. | 831 |
| Cadence Design Systems, Inc. | 221 | Pickering Interfaces, Inc. | 829 |
| Carsem | 611 | Pintail Technologies, Inc. | 224 |
| Cascade Microtech | 96 | Presto Engineering, Inc. | 124 |
| Centellax, Inc. | 814 | Probe Logic | 704 |
| Chip Scale Review | 119 | Protos Electronics, Inc. | 88 |
| Chroma ATE, Inc | 715 | Q-Star Test nv. | 403 |
| CMR Summit Technologies | 701 | QualiSystems | 816 |
| Corad Technology, Inc. | 601 | R&D Circuits | 121 |
| Corelis, Inc. | 610 | Reid-Ashman Manufacturing | 521 |
| DeFacTo Technologies | 835 | Roos Instruments, Inc. | 103 |
| DFT Microsystems, Inc. | 87 | Rucker and Kolls, Inc. | 613 |
| Dynamic Test Solutions | 607 | Sanyu Electric, Inc | 708 |
| EE Evaluation Engineering | 604 | Scanimetrics | 809 |
| Electroglas, Inc. | 101 | Semiconductor Test Consortium | 506 |
| ELES Semiconductor Equipment SpA | 722 | Signal Transfer Technology, Inc. | 111 |
| ERS America | 616 | Silicon Turnkey Solutions | 732 |
| Evans Analytical Group | 821 | Siliconaid Solutions | 422 |
| Everett Charles Technologies | 512 | Simutest, Inc. | 719 |
| Exatron | 730 | Spire Manufacturing | 812 |
| FEINMETALL USA LLC | 811 | Springer Science & Business Media, LLC | 90 |
| Finley Design Services, Inc. | 94 | SV Probe, Inc. - An Ellipsiz Company | 308 |
| Focused Test, Inc. | 407 | Synopsys, Inc. | 212 |
| FormFactor | 631 | SynTest Technologies, Inc. | 731 |
| Geotest-Marvin Test Systems, Inc. | 716 | Taconic | 95 |
| Global Semiconductor Alliance | 810 | TDK-Lambda (formerly Lambda Americas) | 629 |
| GOEPEL electronic GmbH | 624 | Teledyne Relays & Teledyne Coax Switches | 825 |
| GuideTech, Inc. | 803 | Teseda Corporation | 109 |
| HAMAMATSU Corp | 509 | Test & Measurement World | 710 |
| HILEVEL Technology, Inc. | 620 | Test Coach Corporation | 630 |
| IEEE Santa Clara Valley Section | 801 | Test Insight | 412 |
| IEEE Book Sales | 86 | Tokyo Electron Limited (TEL) | 823 |
| Integra Technologies | 726 | Tsodik, Ltd | 706 |
| Integrated Test Corporation | 712 | TSSI - Test Systems Strategies, Inc. | 838 |
| Intellitech Corporation | 218 | TTTC (Test Technology Technical Council) | 85 |
| inTEST Silicon Valley | 409 | Unitechno USA, Inc. | 113 |
| JD Instruments, LLC | 729 | Verigy Ð Inovys DfX Solutions | 93 |
| Johnstech International | 502 | Virage Logic | 115 |
| JTAG Technologies, Inc. | 416 | World Test Systems, Inc. | 724 |
| LogicVision, Inc. | 314 | Yamaichi Electronics USA, Inc | 91 |
