Call for Posters

ITC is now accepting one-page abstracts/proposals for the Poster Session. Submissions are due by Friday, May 27. The poster session will be held on the ITC Exhibits floor in the Disneyland Hotel on Tuesday, September 20.

Posters are a useful way of presenting late-breaking results, getting feedback on an innovative method, or participating  without having to write a full paper. Each poster should describe test-related innovations. Poster contributors must be present at their poster display to engage in technical discussions with the attendees.

The Poster Session is available to conference attendees and exhibitors, and is a good opportunity for exposure. Poster sessions in the past have been well attended and highly interactive. Successful poster submissions can be the basis for a future ITC conference paper. Acceptance as a poster does not preclude submission of a more complete treatment as an ITC paper in 2012 (and beyond). 

Feel free to base your abstract/proposal on any of the suggested topics in the right-hand column. We welcome ideas that are not on this list, and will give them equal consideration.

Last year this event was staged as a beer blast with light-fare snacks. Similar hospitality will be provided this year.

Please visit the ITC Website to submit abstracts/proposals or to view submission instructions. If you have any questions please contact Bill Eklow.

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Sponsors and Supporters

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Conference Focus Topics

• Test- and Design-for-Manufacturability
• Yield Analysis and Optimization
• Embedded Instruments (BIST & DFT)
• Reliability Screening
• Low-Cost Test
• Diagnosis and Silicon Debug
• High-Speed I/O and RF Test
• Probecard Design and Simulation
• Self-Repair and Fault Tolerance
• System Test and False Positives
• Emerging DUTs
• Experiments and Case Studies

Hot Topics

• 3-D/TSV (Through-Silicon Vias)
• Adaptive Test
• Board Test
• Defect-based Testing
• Innovative Industrial Test Practices
• Fault Modeling, Simulation and Test
• Power Issues in Test
• Standalone Memory Test and Repair
• ATE Hardware and Software
• Online Test
• Protocol-aware Test
• Design Verification and Validation
• Test Resource Partitioning
• Test Floor Optimization
• CIS Test

Traditional Topics

• Automatic Test Generation
• Boundary-Scan
• On-Chip Test Compression
• Economics of Test
• FPGA Test
• IDDQ and Current Test
• Interface Issues
• Microprocessor Test
• Mixed-Signal and Analog Test
• Multisite Test
• System-in-Package and KGD Test
• Test Standards
• Test Quality and Reliability