ITC 2015 Panels

Panel 1: “Is IEEE 1149.1 on Its Death Bed?”.

Monday October 5, 4:45 p.m.

As device I/Os become faster and more customized, the capabilities of an IEEE 1149.1 interconnect test becomes marginalized. High-speed SerDes and photonics are putting 1149.1 on life support. Internal to the devices, built-in test instruments are requiring much more bandwidth as semiconductors explode in size and complexity. While standards are in the works for emerging 2.5-D and 3-D devices, the future is uncertain for 1149.1. An esteemed group of panelists will debate the fate of 1149.1 in light of these circumstances. We are expecting a lively and contentious discussion around this topic.

The panel moderator moderator is Kenneth Posse of Avago Technologies.
The Panelists are:

  • Jason Doege, Centaur Technology
  • Jeffery Rearick, AMD
  • Teresa McLaurin, ARM
  • Zoe Conroy, Cisco Systems

A complimentary reception with beer, wine, and soft drinks follows this panel.

Panel 2: Cell-aware ATPG: Beyond the Hype

Wednesday October 7, 10:30 a.m.

2014 was a break-through year for Cell-Aware ATPG, with claims that Cell-Aware ATPG was already a standard feature with several success stories. In 2015, it is time to re-evaluate and look beyond the hype. How effective is Cell-Aware ATPG in detecting real-life defects? Why did it take so long for the ATPG community to come up with this idea? Where/When is Cell-Aware useful? Where/When is it not? These questions and many more will be answered by an esteemed group of panelists. No hype!

The panel moderator moderator is Robert Aitken of ARM; the panel organizers are Erik-Jan Marinissen of IMEC, and Sandeep Goel of TSMC.
The panelists are:

  • Jeff Block, DCG Systems
  • Stefan Eichenberger, NXP Semiconductors
  • Sandeep Goel, TSMC
  • Friedrich Hapke, Mentor Graphics
  • Peter Wohl, Synopsys

Panel 3, Big Data for Test-Big Opportunity or Big Mystery?

Thursday October 8, 2:00 p.m.

Big Data today is undoubtedly a hot topic. For test, Big Data could mean big opportunity. However, before the big opportunity can be identified and realized in practice, practitioners often face several key questions: Is the data infrastructure ready? Is the data sufficient for the application? Has the data mining technology matured for the practical use? Do I need to create a new organization? What will be my expected ROI? and so on. After considering all these questions, Big Data could soon become big mystery. We will invite industrial practitioners to discuss their view on Big Data, from both the business side and the technology side. Through discussion, we hope to find out what the “low-hanging fruits” might be and what challenges to overcome in order to get to those low-hanging fruits.

The panel organizer and moderator is Li-C. Wang, University of California at Santa Barbara.
The panelists are:

  • Kenneth Butler, Texas Instruments
  • Xinli Gu, Huawei Technologies
  • Michael Laisne, Qualcomm
  • Srikanth Venkataraman, Intel Corporation