Significant Papers

Each year, starting 2008, ITC chooses the most significant paper published ten years before.The papers are judged on


  • Impact and Significance

  • Relevance

  • Historical Interest

The awards thus far (by year of publication) are:

1998

A Structured and Scalable Mechanism for Test Access to Embedded Reusable Cores, by E.J. Marinissen, R. Arendsen, G. Bos, H. Dingemanse, M . Lousberg, C. Wouters

1999

Defect-based Delay Testing of Resistive Vias-Contacts: A Critical Evaluation by K. Baker, G. Gronthoud, M. Lousberg, I. Schanstra, C. Hawkins

2000

Wrapper Design for Embedded Core Test by E.J. Marinissen, M. Lousberg, S. Goel\

2001

OPMISR: The Foundation for Compressed ATPG Vectors by C. Barnhart, V. Brunkhorst, F. Distler, O. Farnsworth, B. Keller, B. Koenemann

2002

Embedded Deterministic Test for Low-Cost Manufacturing Test by J. Rajski, M. Kassab, N. Mukherjee, R. Thompson, T. Kun-Han, A. Hertwig, N. Tamarapalli, G. Mrugalski, G. Eide, Mentor Graphics, J. Tyszer, Poznan University of Technology, J. Qian, Cisco Systems

2003

A Case Study of IR-Drop in Structured At-Speed Testing by J. Saxena, K. Butler, V. Jayaram, S. Kundu, N. Arvind and P. Sreeprakash, Texas Instruments; M. Hachinger, Siemens

2004

Scan-based Side-Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard by B. Yang, K. Wu, R. Karri, Polytechnic University

2005

Invisible Delay Quality Lights Up What Could Not Be Seen by Yasuo Sato, Seiji Kajihara, Toshiyuki Maedo, Atsuo Takanori and Y. Nozuyama

2006

Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs by Santiago Ramersaro, Xijiang Lin, Zhuo Zhang, Sudhakar Reddy, Irith Pomeranz and Janusz Rajski