Test Week Tutorials

ITC 2016 Tutorials

ITC 2016 offers 12 tutorials, taught by leading experts, over two days. Catch up on the latest in an area with advanced tutorials or learn the basics. Tutorial titles appear below. Watch this space for more details as they become available.

Sunday Morning, November 13 Sunday Afternoon, November 13
TUTORIAL 1: Testing of TSV-Based 2.5D- AND 3D-Stacked ICs TUTORIAL 4: Testing of Automotive IC’s: Introduction and Advances
TUTORIAL 2: Delay Test: Concepts, Theory and Recent Trends  TUTORIAL 5: Diagnosis Driven Yield Analysis
TUTORIAL 3: Test Opportunities and Challenges for Secure Hardware and Verifying Trust in Integrated Circuits  TUTORIAL 6: Understanding the Unique Fallout from Cell Aware Tests
Monday Morning, November 14 Monday Afternoon, November 14
TUTORIAL 7: Memory Test & Repair in FinFET Era  TUTORIAL 10: Automotive Reliability & Test Strategies
TUTORIAL 8: Test, Diagnosis, And Root-Cause Identification of Failures for Boards and Systems  

TUTORIAL 11: Combining structural and functional test approaches across system levels

TUTORIAL 9: Mixed-Signal DFT & BIST: Trends, Principles, and Solutions TUTORIAL 12: Practices in High Speed I/O Testing