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Chip Design – addresses the information needs of the leading-edge, upper-mainstream, and system-level programmable logic IC designers.
Evaluation Engineering – The magazine for engineers and engineering managers responsible for test and total product quality in electronics.
Future Fab International – Covers all facets of the integrated circuit manufacturing process.
IEEE Design and Test of Computers – Publication that covers current and near-future test practices, including tutorials, how-to articles, and real-world case studies. Topics include IC/module design, low-power design, electronic design automation, design/test verification, practical technology, and standards.
Test & Measurement World – Publication that covers manufacturing test, measurement, inspection, and quality control in the electronics industry.
EETimes – A weekly of interest to all EEs.
Solid State Technology – Covers semiconductors, wafer fabrication, integrated circuits, thin-film microelectronics, flat-panel displays, and microstructure technologies, processes and equipment and more.
ECN – The magazine that provides product solutions for design engineers in the electronics industry.
MicroConnections – The international journal of electronics interconnection.
Test & Measurement Tips – Test and Measurement Tips provides the latest news and information important to the field of test and measurement. Articles range from topics such as meter and tester technology, test equipment and calibration technology. Stay up to date with the latest news in test and measurement today!