๐—ž๐—ถ๐—ฐ๐—ธ๐—ผ๐—ณ๐—ณ ๐—ฒ๐˜ƒ๐—ฒ๐—ฟ๐˜† ๐—บ๐—ผ๐—ฟ๐—ป๐—ถ๐—ป๐—ด ๐—ฎ๐˜ ๐—œ๐—ง๐—– ๐˜„๐—ถ๐˜๐—ต ๐˜๐—ต๐—ผ๐˜‚๐—ด๐—ต๐˜ ๐—น๐—ฒ๐—ฎ๐—ฑ๐—ฒ๐—ฟ๐˜€

๐—ž๐—ถ๐—ฐ๐—ธ๐—ผ๐—ณ๐—ณ ๐—ฒ๐˜ƒ๐—ฒ๐—ฟ๐˜† ๐—บ๐—ผ๐—ฟ๐—ป๐—ถ๐—ป๐—ด ๐—ฎ๐˜ ๐—œ๐—ง๐—– ๐˜„๐—ถ๐˜๐—ต ๐˜๐—ต๐—ฒ๐˜€๐—ฒ ๐˜๐—ต๐—ผ๐˜‚๐—ด๐—ต๐˜ ๐—น๐—ฒ๐—ฎ๐—ฑ๐—ฒ๐—ฟ๐˜€:
Shankar Krishnamoorthy, Steven Hesley, Mike Slessor, Sriram Sankar
No alt text provided for this image

We are excitedย to share the lineup of keynote speakers! Representing the broad spectrum of the semiconductor ecosystem, they will offer their unique perspectives on how test technology needs to keep pace with the rapid innovation happening in the broader electronics industry – from the infrastructure needed pre-silicon to first contact of the silicon itself, as well as the multi-disciplinary collaboration needed to ensure silicon health throughout a product’s lifecycle. Learn how AI is advancing the state of the art in test as well as introducing new challenges such as hard to detect silent data corruption in the hyperscale environment.

Come listen, learn and influence the next wave of test innovation!
If you haven’t registered yet – secure your spot
https://lnkd.in/gSjuurjv
Find out more here: https://lnkd.in/gT_caW45
hashtagitctestweek hashtagIEEE hashtagAI hashtagDFT hashtagDFX hashtagITC hashtagSynopsys hashtagAMD hashtagFormFactor hashtagmeta

0 replies

Leave a Reply

Want to join the discussion?
Feel free to contribute!

Leave a Reply

Your email address will not be published. Required fields are marked *