AI at ITC

Join Us at the AI Track at International Test Conference

We are excited to invite you to the AI Track at this year’s International Test Conference (ITC), where we will explore cutting-edge advancements in AI and its applications in semiconductor testing. The AI track will feature four dynamic sessions, covering a range of innovative topics from industry leaders and researchers.

Here’s a sneak peek of what you can expect:

• Session A1 (Tuesday Afternoon): Learn how AI is transforming semiconductor testing, including TSMC’s vision for AI ecosystems, AI as a Service (AIaaS), and breakthroughs in test time reduction and defect detection.
• Session A2 (Wednesday Morning): Discover novel techniques like WM-Graph for wafermap analytics, XAI frameworks for turbo yield enhancement, and new machine learning flows for optimizing test-time reduction in automotive semiconductors.
• Session A3 (Wednesday afternoon): Delve into advanced methods for synthetic PCM data generation, safety-critical test pattern optimization, and spatial outlier detection with telemetry-based solutions for semiconductor lifecycle management.
• Session A4 (Wednesday afternoon): Don’t miss insightful invited talks from Qualcomm, Siemens, and leading academia, where experts will discuss AI’s future role in semiconductor test automation, ML-driven innovation, and LLM-based AI agents.

Whether you’re working in semiconductor testing, AI/ML applications, or are simply curious about the latest trends, these sessions will provide invaluable insights and networking opportunities.

We hope to see you there!

note:  the above message is from a chatbot based on ITC content  🙂

Here is the overall program:  https://easychair.org/smart-program/ITC2024/bysession-2024-11-05.html