2022 Best paper award

“Language Driven Analytics for Failure Pattern Feedforward and Feedback”,  Min Jian Yang, Yueling (Jenny) Zeng and Li-C. Wang,  University of California, Santa Barbara, USA

2022 honorable mention

“PPA Optimization of Test Points in Automotive Designs”,  Brian Foutz, Sarthak Singhal, Prateek Kumar Rai, Krishna Chakravadhanula, Vivek Chickermane, Bharath Nandakumar, Sameer Chillarige, Christos Papameletis and Satish Ravichandran, Cadence, USA

“DEFCON: Defect Acceleration through Content Optimization”,  Suriyaprakash Natarajan, Abhijit Sathaye, Chaitali Oak, Nipun Chaplot and Suvadeep Banerjee, Intel, USA

TTTC Lifetime Contribution Medal

Magdy Abadir

BSc – University of Alexandria, Egypt (1978)

MSc – University of Saskatchewan (1981)

PhD – University of Southern California (1986)

Senior MTS – MCC (1986 – 1994)

Manager – Test & Verif. Tools, Motorola (1995-2004)

Director – EDA Strategy, Freescale (2004 – 2014)

Founder & CEO – Suitera, LLC (2020 – present)

DFT Knowledge-based system

Interrelationships between Test & Verification

Pioneer in Test Economics

Honors and contributions

10 US Patents, 400 papers, and 5 books

IEEE Fellow – 2006

Adjunct Prof – University of Texas, Austin

Advisor – 12 PhD Students

Editorial Board of D&T, JETTA, Trans. On VLSI

General Chair – VTS (2009, 2010)

Co-Founder & Chair – Test Economics Working

Founder – Microprocessor Test & Verification (MTV)

Founder & Chair – Verification & Security (2016- 2019)

2023 IEEE Fellow Recipient

Chen He, NXP

2023 Bob Madge Innovation Award

Janusz Rajski

TTTC/ITC G. W. Gordon Student Award

Georges Papadimitriou, University of Athens &

Yueling Jenny Zeng, University of California, Santa Barbara